Tian Jin Rong Da Jian Ce You Xian Gong Si

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Enterprise Nature: Private
Operation Mode: Service Suppliers
Location: Nankai District Tianjin City China
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Product Details

Energy spectrum scanning testing machine

Price 1
Unit
Yield /年
Place of Production 天津
Product Category 专业检测服务
Delivery Time

Product Detail Parameters

Product Description

Energy spectrum scanning test mechanism
Tianjin Rong Da Testing Co., Ltd. contact: Wang Jingfu
Cell phone: 13102238283 QQ:3144667033
Telephone: 022-23892103
Test range:
1, polymer, ceramic, concrete, biological, mineral, fiber and other inorganic or organic solid material analysis;
2, the phase analysis of metal materials, composition analysis and the identification of the composition of the inclusions;
3, the surface coating of solid materials, coating analysis, such as: the detection of metal film surface coating;
Identification of 4, gold and silver jewelry, gemstone jewelry, archaeological and cultural relics identification, and forensic identification and other fields;
5. Qualitative and quantitative analysis of the composition of the surface of the material surface, the surface, line and point distribution of elements on the surface of the material.
Principle: when the X - ray photon enters the detector, a certain number of electron hole pairs are excited in the Si (Li) crystal. Have a hole on the minimum average energy epsilon is certain (at low temperature 3.8ev on average), caused by a X ray photon pair number N= E/ delta epsilon, therefore, the incident X ray photon energy is higher, the greater the N. By using the bias voltage at both ends of the crystal to collect the electron hole pair, the pre amplifier is converted to a current pulse, the height of the current pulse depends on the size of the N. After the main amplifier to convert the voltage pulse into the multichannel pulse height analyzer pulse current, pulse height analyzer according to the height of the pulse classification count, so that you can draw a X ray energy according to size distribution map.
Component analysis using X - ray photon characteristic energy of different elements. Energy spectrum analyzer (EDS) is one of the main means of micro area analysis. The usual EDS detection limit is 0.1%-0.5% (element content). Energy resolution of EDS: ~ 130eV.
Test characteristics
1), can quickly, at the same time to all kinds of samples of the micro area of all the elements of Be-U, elements of qualitative and quantitative analysis, a few minutes to complete.
2), the geometric position of the sample and the detector is low, and the results of X - ray scanning and surface distribution can be obtained at low magnification.
3), energy spectrum of the probe current is small: the electron beam irradiation is easy to damage the sample, such as biological samples, fast ion conductor, glass, etc..
4), the detection limit is generally 0.5% - 0.1%, and the quantitative phase error of the non overlapping peak of the medium atomic number is about 2%